High-resolution X-ray spectroscopy demands precision mechanics and flexible design. JJ X-Ray builds customized crystal spectrometers and analyser systems — including von Hamos and Johann geometries — for XES, HERFD-XAS, and related techniques at synchrotron beamlines and laboratory sources. Our von Hamos spectrometers deliver scanning-free, full-spectrum acquisition with large solid-angle acceptance and high resolving power, ideal when photon flux is limited or time resolution is critical.

For more information, please visit the Spectrum Analyzer and Spectrometer product categories.